Journal Of Electronic Testing-Theory And Applications

Journal Abbreviation: J ELECTRON TEST
Journal ISSN: 0923-8174, 1573-0727

About Journal Of Electronic Testing-Theory And Applications

    The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

    A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.
Year IF Total Articles Total Cites
2015/2016 0.361 - 222
2014 0.519 58 261
2013 0.429 64 215
2012 0.454 67 257
2011 0.468 59 237
2010 0.5 49 271
2009 0.473 28 302
2008 0.41 46 308