Journal Of Electronic Testing-Theory And Applications

Journal Abbreviation: J ELECTRON TEST
Journal ISSN: 0923-8174, 1573-0727

About Journal Of Electronic Testing-Theory And Applications

    The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

    A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.
Year Bioxbio Journal Impact* Impact Factor Total Articles
2017/2018 - 0.554 55
2016 - 0.647 57
2015 - 0.361 44
2014 - 0.519 58
*This factor is calculated based on the citation information of journals in our database.

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