Ieee Transactions on Device and Materials Reliability

Journal Abbreviation: IEEE T DEVICE MAT RE
Journal ISSN: 1530-4388

Year Impact Factor (IF) Total Articles Total Cites
2022 (2023 update) 2.0 - 2349
2021 1.886 - 2282
2020 1.761 92 2109
2019 1.407 101 1791
2018 1.583 79 1842
2017 1.512 98 1841
2016 1.575 89 1769
2015 1.437 81 1350
2014 1.890 147 1475
2013 1.544 66 1267
2012 1.516 80 1146
2011 1.543 67 1046
2010 1.483 59 834