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Microelectronics Reliability

Journal Abbreviation: MICROELECTRON RELIAB
Journal ISSN: 0026-2714

About Microelectronics Reliability

    Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.
Year Impact Factor (IF) Total Articles Total Cites
2024 (2025 update) 1.9 - 9221
2023 1.6 - -
2022 1.6 - 8654
2021 1.418 - 8303
2020 1.589 344 7798
2019 1.535 316 7093
2018 1.483 526 6983
2017 1.236 403 6254
2016 1.371 419 6423
2015 1.202 413 4680
2014 1.433 422 4590
2013 1.214 315 4135
2012 1.137 458 3743
2011 1.167 374 3263

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